← SA-15

Logging Syntax

LOW MODERATE HIGH
1 Overlay 5 Related Controls
Graph
Export ▾

Requirements NIST SOURCE

Require the developer of the system or system component to minimize the use of personally identifiable information in development and test environments.

Discussion (NIST Supplemental Guidance)

In support of better incident response and the ability to more quickly reconstruct security-related actions, identifying specific requirements for secure logging facilitates the ability to connect application-produced audit event logs with operational data. Event types are consistent with the event types defined in AU-02.

Implementation Guidance

Engineering Interpretation

Original engineering commentary written for this explorer — not NIST source text and not authoritative guidance.

No engineering interpretation has been authored for SA-15(13) yet. This section is architected to receive it — see the Requirements and Assessment sections above for the authoritative NIST source content in the meantime.

Assessment

No SP 800-53A assessment procedure is recorded for this item in the loaded catalog.

Overlays

Showing the OT/ICS overlay for the parent control SA-15 — see the SA-15(13) entries within each baseline below.

OT/ICS Overlay SP 800-82r3

NIST SP 800-82r3 Appendix F, Table 22. Blank baseline means the control/control enhancement is not selected in that initial OT baseline.

LOW

Not applicable at this tier.

MODERATE

  • Base control: Included (matches standard baseline)
  • Included: (3)

HIGH

  • Base control: Included (matches standard baseline)
  • Included: (3)

STIGs & CCIs

No STIG checks or CCI mappings are currently loaded for SA-15(13). This section is architected to display, per product: STIG ID, Finding ID, Severity, Title, Description, Check, Fix, CCI, and NIST control mapping — but nothing is populated here until a real DISA STIG/CCI dataset is ingested.

Learn more about STIG/CCI integration →

Evidence

No SP 800-53A assessment artifacts are available to derive a potential-evidence view from.